Up to 20 W DC source, up to 200 V or 1 A
Extended range pulsing up to 3 A with 500 W pulse power
100 fA or 100 nV resolution
1.8 MS/s sample rate and 100 kS/s update rate
SourceAdapt technology for fast and stable measurements
Up to 17 SMU channels in a 4U, 19 in. PXI chassis
The NI PXIe-4137 system source measure unit (SMU) delivers high power, precision, and speed in a single-slot PXI Express module. The combination of power, precision, and speed makes this SMU suitable for a broad range of applications including manufacturing test or lab characterization with devices ranging from ICs and discrete devices to board-level test.
The NI PXIe-4137 features 4-quadrant operation and sources up to 20 W of DC power with voltage and current boundaries at ±200 V and ±1 A. With the unique analog-to-digital converter technology of this module, you can perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions at speeds up to 1.8 MS/s. The NI PXIe-4137 is a hardware-timed instrument with a high-speed sequencing engine to synchronize acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
Extended Range Pulsing
For applications requiring higher current, the NI PXIe-4137 can deliver up to 500 W of instantaneous power. Depending on the load and SourceAdapt control settings, pulse widths can be as short as 50 microseconds. These short pulse widths not only allow tests to complete faster but also keep the local heating of the device under test (DUT) to minimal levels so you can perform tests that otherwise might require heat sinks or other thermal control mechanisms.
SourceAdapt: The Next-Generation SMU Technology
You can use the module’s SourceAdapt technology to custom-tune the SMU response to any given load to achieve optimum responses with maximum stability and minimum transients. Removing overshoots helps protect the DUT while eliminating oscillations, which is critical for system stability. Additionally, minimum rise and fall times help ensure the fastest possible test times. This feature is particularly useful when dealing with reactive loads, especially the capacitance loads in a variety of test applications.
